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Optics Letters

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  • Vol. 36, Iss. 15 — Aug. 1, 2011
  • pp: 2752–2754

Reference-free Shack–Hartmann wavefront sensor

Liping Zhao, Wenjiang Guo, Xiang Li, and I-Ming Chen  »View Author Affiliations


Optics Letters, Vol. 36, Issue 15, pp. 2752-2754 (2011)
http://dx.doi.org/10.1364/OL.36.002752


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Abstract

The traditional Shack–Hartmann wavefront sensing (SHWS) system measures the wavefront slope by calculating the centroid shift between the sample and a reference piece, and then the wavefront is reconstructed by a suitable iterative reconstruction method. Because of the necessity of a reference, many issues are brought up, which limit the system in most applications. This Letter proposes a reference-free wavefront sensing (RFWS) methodology, and an RFWS system is built up where wavefront slope changes are measured by introducing a lateral disturbance to the sampling aperture. By using Southwell reconstruction two times to process the measured data, the form of the wavefront at the sampling plane can be well reconstructed. A theoretical simulation platform of RFWS is established, and various surface forms are investigated. Practical measurements with two measurement systems—SHWS and our RFWS—are conducted, analyzed, and compared. All the simulation and measurement results prove and demonstrate the correctness and effectiveness of the method.

© 2011 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(110.7348) Imaging systems : Wavefront encoding

ToC Category:
Image Processing

History
Original Manuscript: January 20, 2011
Revised Manuscript: June 6, 2011
Manuscript Accepted: June 14, 2011
Published: July 19, 2011

Citation
Liping Zhao, Wenjiang Guo, Xiang Li, and I-Ming Chen, "Reference-free Shack–Hartmann wavefront sensor," Opt. Lett. 36, 2752-2754 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-15-2752


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References

  1. Z. Hartmann, Instrumentenk 20, 47 (1900).
  2. R. V. Shack and B.C.Platt, J. Opt. Soc. Am. 61, 656 (1971).
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  7. W. H. Southwell, J. Opt. Soc. Am. 70, 998 (1980). [CrossRef]

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