Abstract
Using a near-field scanning microscope (NT-MDT) with a aperture cantilever held apart from a microaxicon of diameter and period , we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength , with its FWHM being equal to , and the depth of focus being . The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.
© 2011 Optical Society of America
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