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Optics Letters

Optics Letters


  • Vol. 36, Iss. 2 — Jan. 15, 2011
  • pp: 253–255

Antireflective properties of porous Si nanocolumnar structures with graded refractive index layers

Sung Jun Jang, Young Min Song, Jae Su Yu, Chan Il Yeo, and Yong Tak Lee  »View Author Affiliations

Optics Letters, Vol. 36, Issue 2, pp. 253-255 (2011)

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We report on the antireflective characteristics of porous silicon (Si) nanocolumnar structures consisting of graded refractive index layers and carry out a rigorous coupled-wave analysis simulation. The refractive index of Si is gradually modified by a tilted angle electron beam evaporation method. For the fabricated Si nanostructure with a Gaussian index profile of 100 nm , reflectivity (R) of less than 7.5% is obtained with an average value of approximately 2.9% at the wavelength region of 400 800 nm . The experimental results are reasonably consistent with the simulated results for the design of antireflective Si nanostructures.

© 2011 Optical Society of America

OCIS Codes
(040.5350) Detectors : Photovoltaic
(050.6624) Diffraction and gratings : Subwavelength structures
(260.2710) Physical optics : Inhomogeneous optical media

ToC Category:

Original Manuscript: May 19, 2010
Revised Manuscript: October 11, 2010
Manuscript Accepted: November 27, 2010
Published: January 13, 2011

Sung Jun Jang, Young Min Song, Jae Su Yu, Chan Il Yeo, and Yong Tak Lee, "Antireflective properties of porous Si nanocolumnar structures with graded refractive index layers," Opt. Lett. 36, 253-255 (2011)

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