We describe a method where phase and amplitude of a wavefront are obtained by processing a sequence of pattern produced by the interference between the light transmitted by a scanning pinhole (which is sequentially shifted) and a reference pinhole. Simulations and experimental results are presented.
© 2011 Optical Society of America
Original Manuscript: December 23, 2010
Revised Manuscript: February 24, 2011
Manuscript Accepted: February 24, 2011
Published: March 22, 2011
Giancarlo Pedrini, Fucai Zhang, and Wolfgang Osten, "Phase retrieval by pinhole scanning," Opt. Lett. 36, 1113-1115 (2011)