Hard x-ray Zernike microscopy reaches 30 nm resolution

doi:10.1364/OL.36.001269

Hard x-ray Zernike microscopy reaches 30 nm resolution

Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, and G. Margaritondo »View Author Affiliations

Optics Letters, Vol. 36, Issue 7, pp. 1269-1271 (2011)
http://dx.doi.org/10.1364/OL.36.001269

View Full Text Article

Enhanced HTML Acrobat PDF (460 KB)

Journal Search
Article Lookup

Article Tools

Citations

Alert me when this article is cited
Export Citation/Save

Abstract
Article Info
References (15)
Cited By
Figures (5)
Metrics
Related Content

Abstract

Since its invention in 1930, Zernike phase contrast has been a pillar in optical microscopy and more recently in x-ray microscopy, in particular for low-absorption-contrast biological specimens. We experimentally demonstrate that hard-x-ray Zernike microscopy now reaches a lateral resolution below $30 nm$ while strongly enhancing the contrast, thus opening many new research opportunities in biomedicine and materials science.

OCIS Codes
(340.0340) X-ray optics : X-ray optics
(340.7460) X-ray optics : X-ray microscopy

ToC Category:
Microscopy

History
Original Manuscript: November 29, 2010
Revised Manuscript: February 10, 2011
Manuscript Accepted: March 1, 2011
Published: March 30, 2011

Virtual Issues
Vol. 6, Iss. 5 Virtual Journal for Biomedical Optics

Citation
Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, and G. Margaritondo, "Hard x-ray Zernike microscopy reaches 30 nm resolution," Opt. Lett. 36, 1269-1271 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-7-1269

Sort: Author | Year | Journal | Reset

References

F. Zernike, Science 121, 345 (1955). [CrossRef] [PubMed]
D. Rudolph and G. Schmahl, B. Niemann, in Modern Microscopies, Techniques and Applications, A.Michette and P.Duke, eds. (Plenum, 1990), p. 59–67. [CrossRef]
G. Schmahl, D. Rudolph, P. Guttmann, G. Schneider, J. Thieme, and B. Niemann, Rev. Sci. Instrum. 66, 1282 (1995). [CrossRef]
G. Schneider, Ultramicroscopy 75, 85 (1998). [CrossRef] [PubMed]
U. Neuhäusler, G. Schneider, W. Ludwig, M. A. Meyer, E. Zschech, and D. Hambach, J. Phys. D 36, A79 (2003). [CrossRef]
H. Yokosuka, N. Watanabe, T. Ohigashi, Y. Yoshida, S. Maeda, S. Aoki, Y. Suzuki, A. Takeuchi, and H. Takano, J. Synchrotron Radiat. 9, 179 (2002). [CrossRef] [PubMed]
A. Tkachuk, F. Duewer, H. Cui, M. Feser, S. Wang, and W. Yun, Z. Kristallogr. 222, 650 (2007). [CrossRef]
Y. S. Chu, J. M. Yi, F. De Carlo, Q. Shen, W.-K. Lee, H. J. Wu, C. L. Wang, J. Y. Wang, C. J. Liu, C. H. Wang, S. R. Wu, C. C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K. S. Liang, C. S. Yang, J. H. Je, and G. Margaritondo, Appl. Phys. Lett. 92, 103119 (2008). [CrossRef]
M. Stampanoni, R. Mokso, F. Marone, J. Vila-Comamala, S. Gorelik, P. Trtik, K. Jefimovs, and C. David, Phys. Rev. B 81, 14105 (2010). [CrossRef]
H. S. Youn and S.-W. Jung, J. Microsc. 223, 53 (2006). [CrossRef] [PubMed]
Y.-T. Chen, T.-N. Lo, Y. S. Chu, J. Yi, C.-J. Liu, J.-Y. Wang, C.-L. Wang, C.-W. Chiu, T.-E. Hua, Y. Hwu, Q. Shen, G.-C. Yin, K. S. Liang, H.-M. Lin, J. H. Je, and G. Margaritondo, Nanotechnology 19, 395302 (2008). [CrossRef] [PubMed]
D. B. Murphy, Fundamentals of Light Microscopy and Electronic Imaging (Wiley, 2001).
A. G. Michette, Optical Systems for Soft X-rays (Plenum Press, 1986). [CrossRef]
D. L. White, O. R. Wood, II, J. E. Bjorkholm, S. Spector, A. A. MacDowell, and B. LaFontaine, Rev. Sci. Instrum. 66, 1930 (1995). [CrossRef]
A. H. Bennet, H. Jupnik, H. Osterberder, and O. W. Richards, Phase Microscopy (Wiley, 1951).

Aoki, S.
Bennet, A. H.
Bjorkholm, J. E.
Chen, Y.-T.
Chien, C. C.
Chiu, C.-W.
Chu, Y. S.
Cui, H.
David, C.
De Carlo, F.
Duewer, F.
Feser, M.
Gorelik, S.
Guttmann, P.
Hambach, D.
Hua, T.-E.
Hwu, Y.
Je, J. H.
Jefimovs, K.
Jung, S.-W.
Jupnik, H.
LaFontaine, B.
Lee, W.-K.
Liang, K. S.
Lin, H.-M.
Liu, C. J.
Liu, C.-J.
Lo, T.-N.
Ludwig, W.
MacDowell, A. A.
Maeda, S.
Margaritondo, G.
Marone, F.
Meyer, M. A.
Michette, A. G.
Mokso, R.
Murphy, D. B.
Neuhäusler, U.
Niemann, B.
Ohigashi, T.
Osterberder, H.
Richards, O. W.
Rudolph, D.
Schmahl, G.
Schneider, G.
Shen, Q.
Spector, S.
Stampanoni, M.
Suzuki, Y.
Takano, H.
Takeuchi, A.
Thieme, J.
Tkachuk, A.
Trtik, P.
Vila-Comamala, J.
Wang, C. H.
Wang, C. L.
Wang, C.-L.
Wang, J. Y.
Wang, J.-Y.
Wang, S.
Watanabe, N.
White, D. L.
Wood, O. R.
Wu, H. J.
Wu, S. R.
Yang, C. S.
Yi, J.
Yi, J. M.
Yin, G.-C.
Yokosuka, H.
Yoshida, Y.
Youn, H. S.
Yun, W.
Zernike, F.
Zschech, E.

Appl. Phys. Lett.

Y. S. Chu, J. M. Yi, F. De Carlo, Q. Shen, W.-K. Lee, H. J. Wu, C. L. Wang, J. Y. Wang, C. J. Liu, C. H. Wang, S. R. Wu, C. C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K. S. Liang, C. S. Yang, J. H. Je, and G. Margaritondo, Appl. Phys. Lett. 92, 103119 (2008). [CrossRef]

J. Microsc.

H. S. Youn and S.-W. Jung, J. Microsc. 223, 53 (2006). [CrossRef] [PubMed]

J. Phys. D

U. Neuhäusler, G. Schneider, W. Ludwig, M. A. Meyer, E. Zschech, and D. Hambach, J. Phys. D 36, A79 (2003). [CrossRef]

J. Synchrotron Radiat.

H. Yokosuka, N. Watanabe, T. Ohigashi, Y. Yoshida, S. Maeda, S. Aoki, Y. Suzuki, A. Takeuchi, and H. Takano, J. Synchrotron Radiat. 9, 179 (2002). [CrossRef] [PubMed]

Nanotechnology

Y.-T. Chen, T.-N. Lo, Y. S. Chu, J. Yi, C.-J. Liu, J.-Y. Wang, C.-L. Wang, C.-W. Chiu, T.-E. Hua, Y. Hwu, Q. Shen, G.-C. Yin, K. S. Liang, H.-M. Lin, J. H. Je, and G. Margaritondo, Nanotechnology 19, 395302 (2008). [CrossRef] [PubMed]

Phys. Rev. B

M. Stampanoni, R. Mokso, F. Marone, J. Vila-Comamala, S. Gorelik, P. Trtik, K. Jefimovs, and C. David, Phys. Rev. B 81, 14105 (2010). [CrossRef]

Rev. Sci. Instrum.

G. Schmahl, D. Rudolph, P. Guttmann, G. Schneider, J. Thieme, and B. Niemann, Rev. Sci. Instrum. 66, 1282 (1995). [CrossRef]
D. L. White, O. R. Wood, II, J. E. Bjorkholm, S. Spector, A. A. MacDowell, and B. LaFontaine, Rev. Sci. Instrum. 66, 1930 (1995). [CrossRef]

Science

F. Zernike, Science 121, 345 (1955). [CrossRef] [PubMed]

Ultramicroscopy

G. Schneider, Ultramicroscopy 75, 85 (1998). [CrossRef] [PubMed]

Z. Kristallogr.

A. Tkachuk, F. Duewer, H. Cui, M. Feser, S. Wang, and W. Yun, Z. Kristallogr. 222, 650 (2007). [CrossRef]

Other

D. Rudolph and G. Schmahl, B. Niemann, in Modern Microscopies, Techniques and Applications, A.Michette and P.Duke, eds. (Plenum, 1990), p. 59–67. [CrossRef]
A. H. Bennet, H. Jupnik, H. Osterberder, and O. W. Richards, Phase Microscopy (Wiley, 1951).
D. B. Murphy, Fundamentals of Light Microscopy and Electronic Imaging (Wiley, 2001).
A. G. Michette, Optical Systems for Soft X-rays (Plenum Press, 1986). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Click here to see a list of articles that cite this paper

Figures


Fig. 1	Fig. 2	Fig. 3


Fig. 4	Fig. 5

« Previous Article | Next Article »

OSA is a member of CrossRef.

[1] F. Zernike, Science 121, 345 (1955). [CrossRef] [PubMed]

[2] D. Rudolph and G. Schmahl, B. Niemann, in Modern Microscopies, Techniques and Applications, A.Michette and P.Duke, eds. (Plenum, 1990), p. 59–67. [CrossRef]

[3] G. Schmahl, D. Rudolph, P. Guttmann, G. Schneider, J. Thieme, and B. Niemann, Rev. Sci. Instrum. 66, 1282 (1995). [CrossRef]

[4] G. Schneider, Ultramicroscopy 75, 85 (1998). [CrossRef] [PubMed]

[5] U. Neuhäusler, G. Schneider, W. Ludwig, M. A. Meyer, E. Zschech, and D. Hambach, J. Phys. D 36, A79 (2003). [CrossRef]

[6] H. Yokosuka, N. Watanabe, T. Ohigashi, Y. Yoshida, S. Maeda, S. Aoki, Y. Suzuki, A. Takeuchi, and H. Takano, J. Synchrotron Radiat. 9, 179 (2002). [CrossRef] [PubMed]

[7] A. Tkachuk, F. Duewer, H. Cui, M. Feser, S. Wang, and W. Yun, Z. Kristallogr. 222, 650 (2007). [CrossRef]

[8] Y. S. Chu, J. M. Yi, F. De Carlo, Q. Shen, W.-K. Lee, H. J. Wu, C. L. Wang, J. Y. Wang, C. J. Liu, C. H. Wang, S. R. Wu, C. C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K. S. Liang, C. S. Yang, J. H. Je, and G. Margaritondo, Appl. Phys. Lett. 92, 103119 (2008). [CrossRef]

[9] M. Stampanoni, R. Mokso, F. Marone, J. Vila-Comamala, S. Gorelik, P. Trtik, K. Jefimovs, and C. David, Phys. Rev. B 81, 14105 (2010). [CrossRef]

[10] H. S. Youn and S.-W. Jung, J. Microsc. 223, 53 (2006). [CrossRef] [PubMed]

[11] Y.-T. Chen, T.-N. Lo, Y. S. Chu, J. Yi, C.-J. Liu, J.-Y. Wang, C.-L. Wang, C.-W. Chiu, T.-E. Hua, Y. Hwu, Q. Shen, G.-C. Yin, K. S. Liang, H.-M. Lin, J. H. Je, and G. Margaritondo, Nanotechnology 19, 395302 (2008). [CrossRef] [PubMed]

[12] D. B. Murphy, Fundamentals of Light Microscopy and Electronic Imaging (Wiley, 2001).

[13] A. G. Michette, Optical Systems for Soft X-rays (Plenum Press, 1986). [CrossRef]

[14] D. L. White, O. R. Wood, II, J. E. Bjorkholm, S. Spector, A. A. MacDowell, and B. LaFontaine, Rev. Sci. Instrum. 66, 1930 (1995). [CrossRef]

[15] A. H. Bennet, H. Jupnik, H. Osterberder, and O. W. Richards, Phase Microscopy (Wiley, 1951).

OpticsInfoBase

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

Hard x-ray Zernike microscopy reaches 30 nm resolution