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Optics Letters

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  • Vol. 36, Iss. 7 — Apr. 1, 2011
  • pp: 1269–1271

Hard x-ray Zernike microscopy reaches 30 nm resolution

Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, and G. Margaritondo  »View Author Affiliations


Optics Letters, Vol. 36, Issue 7, pp. 1269-1271 (2011)
http://dx.doi.org/10.1364/OL.36.001269


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Abstract

Since its invention in 1930, Zernike phase contrast has been a pillar in optical microscopy and more recently in x-ray microscopy, in particular for low-absorption-contrast biological specimens. We experimentally demonstrate that hard-x-ray Zernike microscopy now reaches a lateral resolution below 30 nm while strongly enhancing the contrast, thus opening many new research opportunities in biomedicine and materials science.

© 2011 Optical Society of America

OCIS Codes
(340.0340) X-ray optics : X-ray optics
(340.7460) X-ray optics : X-ray microscopy

ToC Category:
Microscopy

History
Original Manuscript: November 29, 2010
Revised Manuscript: February 10, 2011
Manuscript Accepted: March 1, 2011
Published: March 30, 2011

Virtual Issues
Vol. 6, Iss. 5 Virtual Journal for Biomedical Optics

Citation
Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, and G. Margaritondo, "Hard x-ray Zernike microscopy reaches 30 nm resolution," Opt. Lett. 36, 1269-1271 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-7-1269


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