Ultrahigh-sensitivity infrared detection system using an InGaAs p-i-n photodiode with low dielectric polarization noise

doi:10.1364/OL.37.002235

Ultrahigh-sensitivity infrared detection system using an InGaAs p-i-n photodiode with low dielectric polarization noise

Makoto Akiba and Yoshikazu Kanai »View Author Affiliations

Optics Letters, Vol. 37, Issue 12, pp. 2235-2237 (2012)
http://dx.doi.org/10.1364/OL.37.002235

View Full Text Article

Enhanced HTML Acrobat PDF (403 KB)

Journal Search
Article Lookup

Article Tools

Citations

Alert me when this article is cited
Export Citation/Save

Abstract
Article Info
References (15)
Cited By
Figures (4)
Metrics
Related Content

Abstract

We developed a highly sensitive infrared photodetection system using an InGaAs $p - i - n$ photodiode. The temperature and data sampling rate dependences of the readout noise were measured to determine the optimum temperature for low-noise detection. The optimum temperature for sampling rates below 100 Hz was 100 K, and the readout noise at 1 Hz was 2.5 e. The readout noise at 1 MHz and 140 K was 49.4 e. The light detection limit of the system was $8.2 \times 10^{- 19} W$ at a wavelength of 1.3 μm. The spectral noise densities of a readout circuit were measured in order to determine the origin of noise.

OCIS Codes
(040.0040) Detectors : Detectors
(040.3060) Detectors : Infrared
(040.3780) Detectors : Low light level
(040.5160) Detectors : Photodetectors
(040.5350) Detectors : Photovoltaic

ToC Category:
Detectors

History
Original Manuscript: March 1, 2012
Revised Manuscript: April 17, 2012
Manuscript Accepted: April 17, 2012
Published: June 6, 2012

Citation
Makoto Akiba and Yoshikazu Kanai, "Ultrahigh-sensitivity infrared detection system using an InGaAs p-i-n photodiode with low dielectric polarization noise," Opt. Lett. 37, 2235-2237 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-12-2235

Sort: Author | Year | Journal | Reset

References

C. H. Phang, D. S. H. Chan, S. L. Tan, W. B. Len, K.H. Yim, L. S. Koh, C. M. Chua, and L. J. Balk, in Proceedings of the 12th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IEEE, 2005), pp. 275–281.
A. Roda, P. Pasini, M. Mirasoli, E. Michelini, and M. Guardigli, Trends Biotechnol. 22, 295 (2004). [CrossRef]
S. Kaminaka, T. Ito, H. Yamazaki, E. Kohda, and H. Hamaguchi, J. Raman Spectrosc. 33, 498 (2002). [CrossRef]
M. Makiuchi, J. Miyazaki, T. Shiraishi, K. Kakinuma, and H. Inaba, IEEE Photon. Technol. Lett. 9, 1514 (1997). [CrossRef]
T. Maruyama, F. Narusawa, M. Kudo, and M. Tanaka, Opt. Eng. 41, 395 (2002). [CrossRef]
A. Tosi, A. D. Mora, F. Zappa, S. Cova, M. A. Itzler, and X. Jiang, Proc. SPIE 7222, 72221G (2009). [CrossRef]
X. Jiang, M. A. Itzler, R. Ben-Michael, and K. Slomkowski, IEEE J. Sel. Top. Quantum Electron. 13, 895 (2007). [CrossRef]
M. Akiba, Proc. SPIE 4130, 850 (2000). [CrossRef]
H. Bouchiat and M. Ocio, Comments Cond. Mat. Phys. 14, 163 (1988).
M. Akiba and M. Fujiwara, Opt. Lett. 28, 1010 (2003). [CrossRef]
D. F. Barbe, Proc. IEEE 63, 38 (1975). [CrossRef]
M. Akiba, Jpn. J. Appl. Phys. 38, L558 (1999). [CrossRef]
A. K. Jonscher, Nature 267, 673 (1977). [CrossRef]
B. S. Lim, A. V. Vaysleyb, and A. S. Nowick, Appl. Phys. A 56, 8 (1993). [CrossRef]
F. M. Klaassen and J. R. Robinson, IEEE Trans. Electron Devices 17, 852 (1970). [CrossRef]

Akiba, M.
Balk, L. J.
Barbe, D. F.
Ben-Michael, R.
Bouchiat, H.
Chan, D. S. H.
Chua, C. M.
Cova, S.
Fujiwara, M.
Guardigli, M.
Hamaguchi, H.
Inaba, H.
Ito, T.
Itzler, M. A.
Jiang, X.
Jonscher, A. K.
Kakinuma, K.
Kaminaka, S.
Klaassen, F. M.
Koh, L. S.
Kohda, E.
Kudo, M.
Len, W. B.
Lim, B. S.
Makiuchi, M.
Maruyama, T.
Michelini, E.
Mirasoli, M.
Miyazaki, J.
Mora, A. D.
Narusawa, F.
Nowick, A. S.
Ocio, M.
Pasini, P.
Phang, C. H.
Robinson, J. R.
Roda, A.
Shiraishi, T.
Slomkowski, K.
Tan, S. L.
Tanaka, M.
Tosi, A.
Vaysleyb, A. V.
Yamazaki, H.
Yim, K.H.
Zappa, F.

Appl. Phys. A

B. S. Lim, A. V. Vaysleyb, and A. S. Nowick, Appl. Phys. A 56, 8 (1993). [CrossRef]

Comments Cond. Mat. Phys.

H. Bouchiat and M. Ocio, Comments Cond. Mat. Phys. 14, 163 (1988).

IEEE J. Sel. Top. Quantum Electron.

X. Jiang, M. A. Itzler, R. Ben-Michael, and K. Slomkowski, IEEE J. Sel. Top. Quantum Electron. 13, 895 (2007). [CrossRef]

IEEE Photon. Technol. Lett.

M. Makiuchi, J. Miyazaki, T. Shiraishi, K. Kakinuma, and H. Inaba, IEEE Photon. Technol. Lett. 9, 1514 (1997). [CrossRef]

IEEE Trans. Electron Devices

F. M. Klaassen and J. R. Robinson, IEEE Trans. Electron Devices 17, 852 (1970). [CrossRef]

J. Raman Spectrosc.

S. Kaminaka, T. Ito, H. Yamazaki, E. Kohda, and H. Hamaguchi, J. Raman Spectrosc. 33, 498 (2002). [CrossRef]

Jpn. J. Appl. Phys.

M. Akiba, Jpn. J. Appl. Phys. 38, L558 (1999). [CrossRef]

Nature

A. K. Jonscher, Nature 267, 673 (1977). [CrossRef]

Opt. Eng.

T. Maruyama, F. Narusawa, M. Kudo, and M. Tanaka, Opt. Eng. 41, 395 (2002). [CrossRef]

Opt. Lett.

M. Akiba and M. Fujiwara, Opt. Lett. 28, 1010 (2003). [CrossRef]

Proc. IEEE

D. F. Barbe, Proc. IEEE 63, 38 (1975). [CrossRef]

Proc. SPIE

M. Akiba, Proc. SPIE 4130, 850 (2000). [CrossRef]
A. Tosi, A. D. Mora, F. Zappa, S. Cova, M. A. Itzler, and X. Jiang, Proc. SPIE 7222, 72221G (2009). [CrossRef]

Trends Biotechnol.

A. Roda, P. Pasini, M. Mirasoli, E. Michelini, and M. Guardigli, Trends Biotechnol. 22, 295 (2004). [CrossRef]

Other

C. H. Phang, D. S. H. Chan, S. L. Tan, W. B. Len, K.H. Yim, L. S. Koh, C. M. Chua, and L. J. Balk, in Proceedings of the 12th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IEEE, 2005), pp. 275–281.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Click here to see a list of articles that cite this paper

Figures


Fig. 1.	Fig. 2.	Fig. 3.


Fig. 4.

« Previous Article | Next Article »

OSA is a member of CrossRef.

[1] C. H. Phang, D. S. H. Chan, S. L. Tan, W. B. Len, K.H. Yim, L. S. Koh, C. M. Chua, and L. J. Balk, in Proceedings of the 12th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IEEE, 2005), pp. 275–281.

[2] A. Roda, P. Pasini, M. Mirasoli, E. Michelini, and M. Guardigli, Trends Biotechnol. 22, 295 (2004). [CrossRef]

[3] S. Kaminaka, T. Ito, H. Yamazaki, E. Kohda, and H. Hamaguchi, J. Raman Spectrosc. 33, 498 (2002). [CrossRef]

[4] M. Makiuchi, J. Miyazaki, T. Shiraishi, K. Kakinuma, and H. Inaba, IEEE Photon. Technol. Lett. 9, 1514 (1997). [CrossRef]

[5] T. Maruyama, F. Narusawa, M. Kudo, and M. Tanaka, Opt. Eng. 41, 395 (2002). [CrossRef]

[6] A. Tosi, A. D. Mora, F. Zappa, S. Cova, M. A. Itzler, and X. Jiang, Proc. SPIE 7222, 72221G (2009). [CrossRef]

[7] X. Jiang, M. A. Itzler, R. Ben-Michael, and K. Slomkowski, IEEE J. Sel. Top. Quantum Electron. 13, 895 (2007). [CrossRef]

[8] M. Akiba, Proc. SPIE 4130, 850 (2000). [CrossRef]

[9] H. Bouchiat and M. Ocio, Comments Cond. Mat. Phys. 14, 163 (1988).

[10] M. Akiba and M. Fujiwara, Opt. Lett. 28, 1010 (2003). [CrossRef]

[11] D. F. Barbe, Proc. IEEE 63, 38 (1975). [CrossRef]

[12] M. Akiba, Jpn. J. Appl. Phys. 38, L558 (1999). [CrossRef]

[13] A. K. Jonscher, Nature 267, 673 (1977). [CrossRef]

[14] B. S. Lim, A. V. Vaysleyb, and A. S. Nowick, Appl. Phys. A 56, 8 (1993). [CrossRef]

[15] F. M. Klaassen and J. R. Robinson, IEEE Trans. Electron Devices 17, 852 (1970). [CrossRef]

OpticsInfoBase

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

Ultrahigh-sensitivity infrared detection system using an InGaAs p-i-n photodiode with low dielectric polarization noise