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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 37, Iss. 12 — Jun. 15, 2012
  • pp: 2340–2342

Shrinkage of picosecond laser beam by plasma reflection in super-resolution near-field structure of SiN/Sb/SiN thin film

Yi-Ci Li, Huei-Ling Lin, Po-Yuan Huang, Li Xin, Sidney S. Yang, Jaw-Luen Tang, and Tai-Huei Wei  »View Author Affiliations


Optics Letters, Vol. 37, Issue 12, pp. 2340-2342 (2012)
http://dx.doi.org/10.1364/OL.37.002340


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Abstract

The transmittive and reflective Z-scan technique is used with a 10 Hz, frequency doubled, Q-switched, and mode-locked Nd:YAG laser to verify that the reflectivity of the super-resolution near-field structure of an SiN/Sb/SiN thin film increases as incident intensity decreases. This intensity-dependent reflection, called nonlinear reflection, reflects a TEM00 mode laser beam more strongly at its periphery than at its center and so shrinks the transmitted laser beam. The observed nonlinear reflection is attributed to laser-induced change of carrier densities in Sb, to justify quantitatively the experimental results.

© 2012 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Nonlinear Optics

History
Original Manuscript: February 22, 2012
Manuscript Accepted: April 5, 2012
Published: June 11, 2012

Citation
Yi-Ci Li, Huei-Ling Lin, Po-Yuan Huang, Li Xin, Sidney S. Yang, Jaw-Luen Tang, and Tai-Huei Wei, "Shrinkage of picosecond laser beam by plasma reflection in super-resolution near-field structure of SiN/Sb/SiN thin film," Opt. Lett. 37, 2340-2342 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-12-2340


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