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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 37, Iss. 15 — Aug. 1, 2012
  • pp: 3282–3284

Single-shot full-field interferometric polarimeter with an integrated calibration scheme

Dinesh N. Naik, Rakesh Kumar Singh, Hitoshi Itou, Maruthi M. Brundavanam, Yoko Miyamoto, and Mitsuo Takeda  »View Author Affiliations


Optics Letters, Vol. 37, Issue 15, pp. 3282-3284 (2012)
http://dx.doi.org/10.1364/OL.37.003282


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Abstract

A simple interferometric polarimeter with an integrated calibration scheme is proposed for accurate and fast mapping of the state of polarization (SOP). Conventional single-shot polarimeters that detect the amplitude and phase of orthogonally polarized field components by interferometry using Fourier fringe analysis suffers from errors caused by the imperfect reference beam and ambiguity in the spatial carrier frequency in the fringe pattern. In the proposed system, the integrated calibration scheme eliminates those error sources and enables accurate measurement of SOP without prior knowledge of the reference beam and the spatial carrier frequency.

© 2012 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization

ToC Category:
Physical Optics

History
Original Manuscript: May 18, 2012
Revised Manuscript: June 28, 2012
Manuscript Accepted: June 30, 2012
Published: July 31, 2012

Citation
Dinesh N. Naik, Rakesh Kumar Singh, Hitoshi Itou, Maruthi M. Brundavanam, Yoko Miyamoto, and Mitsuo Takeda, "Single-shot full-field interferometric polarimeter with an integrated calibration scheme," Opt. Lett. 37, 3282-3284 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-15-3282


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