OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 17 — Sep. 1, 2012
  • pp: 3651–3653

Nanoscale avalanche photodiode with self-quenching and ultrahigh ultraviolet/visible rejection ratio

Rongdun Hong, Yi Zhou, Yannan Xie, Xiaping Chen, Zifeng Zhang, Kang L. Wang, and Zhengyun Wu  »View Author Affiliations


Optics Letters, Vol. 37, Issue 17, pp. 3651-3653 (2012)
http://dx.doi.org/10.1364/OL.37.003651


View Full Text Article

Enhanced HTML    Acrobat PDF (405 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A 4H-SiC based separate-absorption-multiplication (SAM) avalanche photodiode with a nanoscale multiplication region and a bulk absorption region is proposed and its optoelectronic performance is modeled. The results show that the avalanche breakdown voltage of the device is found to be dependent on the illumination condition. This is attributed to the existence of an illumination-dependent hole potential well in the upper center of the absorption region. Based on the illumination-dependence of avalanche breakdown voltage, a self-quenching and an ultrahigh UV/visible rejection ratio have been realized in this structure.

© 2012 Optical Society of America

OCIS Codes
(040.0040) Detectors : Detectors
(040.5160) Detectors : Photodetectors
(040.7190) Detectors : Ultraviolet
(040.1345) Detectors : Avalanche photodiodes (APDs)

ToC Category:
Detectors

History
Original Manuscript: May 21, 2012
Revised Manuscript: July 19, 2012
Manuscript Accepted: July 19, 2012
Published: August 28, 2012

Citation
Rongdun Hong, Yi Zhou, Yannan Xie, Xiaping Chen, Zifeng Zhang, Kang L. Wang, and Zhengyun Wu, "Nanoscale avalanche photodiode with self-quenching and ultrahigh ultraviolet/visible rejection ratio," Opt. Lett. 37, 3651-3653 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-17-3651


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. F. Yan, Y. Luo, J. H. Zhao, and G. H. Olsen, Electron Lett. 35, 929 (1999). [CrossRef]
  2. H.-Ying Lee, H.-Lin Huang, and C.-Ting Lee, IEEE Photon. Technol. Lett. 23, 706 (2011). [CrossRef]
  3. M.-L. Lee, T. S. Mue, F. W. Huang, J. H. Yang, and J. K. Sheu, Opt. Express 19, 12658 (2011). [CrossRef]
  4. X. Kong, C. Liu, W. Dong, X. Zhang, C. Tao, L. Shen, J. Zhou, Y. Fei, and S. Ruan, Appl. Phys. Lett. 94, 123502 (2009). [CrossRef]
  5. R. Yan, D. Gargas, and P. Yang, Nature Photon. 3, 569 (2009). [CrossRef]
  6. H. Kind, H. Yan, B. Messer, M. Law, and P. Yang, Adv. Mater. 14, 158 (2002). [CrossRef]
  7. Y. Han, G. Wu, H. Li, M. Wang, and H. Chen, Nanotechnology 21, 185708 (2010). [CrossRef]
  8. O. Hayden, R. Agarwal, and C. M. Lieber, Nature Mater. 5, 352 (2006). [CrossRef]
  9. M. Razeghi and A. Rogalski, J. Appl. Phys. 79, 7433 (1996). [CrossRef]
  10. X. Guo, A. L. Beck, Z. Huang, N. Duan, J. C. Campbell, D. Emerson, and J. J. Sumakeris, IEEE Trans. Electron Devices 53, 2259 (2006). [CrossRef]
  11. X. Zhang, P. Kung, D. Walker, J. Piotrowski, A. Rogalski, A. Saxler, and M. Razeghi, Appl. Phys. Lett. 67, 2028 (1995). [CrossRef]
  12. M. Razeghi, Proc. IEEE 90, 1006 (2002). [CrossRef]
  13. A. Vert, S. Soloviev, and P. Sandvik, Mater. Sci. Forum 645–648, 1069 (2010). [CrossRef]
  14. X. Guo, A. Beck, Z. Huang, N. Duan, J. Campbell, D. Emerson, and J. Sumakeris, IEEE Trans. Electron Devices 53, 2259 (2006). [CrossRef]
  15. W. Loh, B. Ng, J. Ng, S. Soloviev, H.-Y. Cha, P. Sandvik, C. John-son, and J. David, IEEE Trans. Electron Devices 55, 1984 (2008). [CrossRef]
  16. K. Li, H. Liu, Q. Zhou, D. Mcintosh, and J. C. Campbell, Opt. Express 18, 11713 (2010). [CrossRef]
  17. H. Cha and P. M. Sandvik, Jpn. J. Appl. Phys. 47, 5423 (2008). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1. Fig. 2. Fig. 3.
 
Fig. 4.
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited