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Reflective interferometry for optical metamaterial phase measurements |
Optics Letters, Vol. 37, Issue 19, pp. 4089-4091 (2012)
http://dx.doi.org/10.1364/OL.37.004089
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Abstract
The unambiguous determination of optical refractive indices of
metamaterials is a challenging task for device applications and the study of new
optical phenomena. We demonstrate here simple broadband phase measurements of
metamaterials using spectrally and spatially resolved interferometry. We study
the phase response of a
© 2012 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(310.6628) Thin films : Subwavelength structures, nanostructures
ToC Category:
Interferometry
History
Original Manuscript: July 3, 2012
Revised Manuscript: August 29, 2012
Manuscript Accepted: August 31, 2012
Published: September 26, 2012
Citation
Kevin O’Brien, N. D. Lanzillotti-Kimura, Haim Suchowski, Boubacar Kante, Yongshik Park, Xiaobo Yin, and Xiang Zhang, "Reflective interferometry for optical metamaterial phase measurements," Opt. Lett. 37, 4089-4091 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-19-4089
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