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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 19 — Oct. 1, 2012
  • pp: 4140–4142

Evaluation algorithms for multistep measurement of spatially varying linear polarization and phase

Andreas Berger, Vanusch Nercissian, Klaus Mantel, and Irina Harder  »View Author Affiliations


Optics Letters, Vol. 37, Issue 19, pp. 4140-4142 (2012)
http://dx.doi.org/10.1364/OL.37.004140


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Abstract

Optical components manipulating both polarization and phase of wave fields find more and more applications in today’s optical systems. In particular, the polarization orientation may vary across the aperture. New measurement techniques and evaluation algorithms are needed to simultaneously characterize the properties of such elements. In this Letter, a general measurement algorithm for locally linear polarization distributions is presented, extending the methods of phase shifting interferometry to the simultaneous determination of polarization and phase. A class of evaluation algorithms is derived, and some example algorithms are described and tested for their resilience against systematic and stochastic stepping errors.

© 2012 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 2, 2012
Revised Manuscript: August 29, 2011
Manuscript Accepted: August 30, 2012
Published: September 28, 2012

Citation
Andreas Berger, Vanusch Nercissian, Klaus Mantel, and Irina Harder, "Evaluation algorithms for multistep measurement of spatially varying linear polarization and phase," Opt. Lett. 37, 4140-4142 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-19-4140

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