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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 37, Iss. 20 — Oct. 15, 2012
  • pp: 4338–4340

Terahertz detection using spectral domain interferometry

Gargi Sharma, Kanwarpal Singh, Ibraheem Al-Naib, Roberto Morandotti, and Tsuneyuki Ozaki  »View Author Affiliations


Optics Letters, Vol. 37, Issue 20, pp. 4338-4340 (2012)
http://dx.doi.org/10.1364/OL.37.004338


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Abstract

In this work, we present a novel method based on spectral domain interferometry for the electro-optic (EO) sampling of terahertz (THz) electric fields. This technique allows the use of thick crystals without the drawback of the over-rotation that may occur with intense THz sources, allowing longer temporal scans and thus, better spectral resolution. Using this technique, a phase difference of approximately 8898π can be measured, which is 18,000 times larger than the phase difference that could be measured using EO sampling.

© 2012 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(040.2235) Detectors : Far infrared or terahertz
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Detectors

History
Original Manuscript: August 10, 2012
Manuscript Accepted: August 30, 2012
Published: October 12, 2012

Citation
Gargi Sharma, Kanwarpal Singh, Ibraheem Al-Naib, Roberto Morandotti, and Tsuneyuki Ozaki, "Terahertz detection using spectral domain interferometry," Opt. Lett. 37, 4338-4340 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-20-4338


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