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High dynamic range microscope infrared imaging of silicon nanophotonic devices |
Optics Letters, Vol. 37, Issue 22, pp. 4705-4707 (2012)
http://dx.doi.org/10.1364/OL.37.004705
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Abstract
A noninvasive diagnostic technique based on wavelength-resolved and magnified infrared images of weakly scattered light from a silicon photonic device may be useful to infer component characteristics, such as waveguide-resonator coupling, loss, quality factor, etc., at multiple locations, without the constraint of input/output couplers. Here, we demonstrate the benefit of high dynamic range microscope imaging for a silicon coupled microresonator device.
© 2012 Optical Society of America
OCIS Codes
(110.4190) Imaging systems : Multiple imaging
(130.2790) Integrated optics : Guided waves
(230.4555) Optical devices : Coupled resonators
(040.6808) Detectors : Thermal (uncooled) IR detectors, arrays and imaging
ToC Category:
Imaging Systems
History
Original Manuscript: August 28, 2012
Revised Manuscript: October 10, 2012
Manuscript Accepted: October 10, 2012
Published: November 9, 2012
Citation
Shayan Mookherjea and Hannah R. Grant, "High dynamic range microscope infrared imaging of silicon nanophotonic devices," Opt. Lett. 37, 4705-4707 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-22-4705
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