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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 37, Iss. 23 — Dec. 1, 2012
  • pp: 4829–4831

Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization

J. Liu, F. J. Li, Y. L. Jiang, C. Li, Y. X. Leng, T. Kobayashi, R. X. Li, and Z. Z. Xu  »View Author Affiliations


Optics Letters, Vol. 37, Issue 23, pp. 4829-4831 (2012)
http://dx.doi.org/10.1364/OL.37.004829


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Abstract

We propose a technique for measuring infrared femtosecond pulses: transient-grating self-referenced spectral interferometry. Based on this technique, we built an extremely simple, alignment-free device and successfully characterized both 38 fs pulses at 800 nm and sub-two-cycle 10 fs pulses at 1.75 μm.

© 2012 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7120) Ultrafast optics : Ultrafast phenomena

ToC Category:
Ultrafast Optics

History
Original Manuscript: September 28, 2012
Revised Manuscript: October 19, 2012
Manuscript Accepted: October 19, 2012
Published: November 16, 2012

Citation
J. Liu, F. J. Li, Y. L. Jiang, C. Li, Y. X. Leng, T. Kobayashi, R. X. Li, and Z. Z. Xu, "Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization," Opt. Lett. 37, 4829-4831 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-23-4829


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References

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