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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 24 — Dec. 15, 2012
  • pp: 5073–5075

Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer

Petri Karvinen, Simon Rutishauser, Aldo Mozzanica, Dominic Greiffenberg, Pavle N. Juranić, Andreas Menzel, Alberto Lutman, Jacek Krzywinski, David M. Fritz, Henrik T. Lemke, Marco Cammarata, and Christian David  »View Author Affiliations


Optics Letters, Vol. 37, Issue 24, pp. 5073-5075 (2012)
http://dx.doi.org/10.1364/OL.37.005073


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Abstract

We present a spectrometer setup based on grating dispersion for hard x-ray free-electron lasers. This setup consists of a focusing spectrometer grating and a charge-integrating microstrip detector. Measurement results acquired at Linac Coherent Light Source are presented, demonstrating noninvasive monitoring of single-shot spectra with a resolution of 2.0×104±0.3×104 at photon energy of 6 keV with more than 95% transmission of the main beam.

© 2012 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(140.2600) Lasers and laser optics : Free-electron lasers (FELs)
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

History
Original Manuscript: October 2, 2012
Revised Manuscript: November 16, 2012
Manuscript Accepted: November 19, 2012
Published: December 10, 2012

Citation
Petri Karvinen, Simon Rutishauser, Aldo Mozzanica, Dominic Greiffenberg, Pavle N. Juranić, Andreas Menzel, Alberto Lutman, Jacek Krzywinski, David M. Fritz, Henrik T. Lemke, Marco Cammarata, and Christian David, "Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer," Opt. Lett. 37, 5073-5075 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-24-5073


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