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Agile linear interferometric method for carrier-envelope phase drift measurement |
Optics Letters, Vol. 37, Issue 5, pp. 836-838 (2012)
http://dx.doi.org/10.1364/OL.37.000836
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Abstract
A bandwidth-independent and linear interferometric method for the measurement of the carrier-envelope phase drift of ultrashort pulse trains is demonstrated. The pulses are temporally overlapped in a resonant multiple-beam interferometer. From the position of the spectral interference pattern, the relative carrier-envelope phase between two subsequent oscillator pulses is obtained at data acquisition rates up to 200 Hz. Cross calibration has been performed by
© 2012 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7090) Ultrafast optics : Ultrafast lasers
ToC Category:
Ultrafast Optics
History
Original Manuscript: November 3, 2011
Revised Manuscript: December 30, 2011
Manuscript Accepted: January 19, 2012
Published: February 22, 2012
Citation
P. Jójárt, Á. Börzsönyi, B. Borchers, G. Steinmeyer, and K. Osvay, "Agile linear interferometric method for carrier-envelope phase drift measurement," Opt. Lett. 37, 836-838 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-5-836
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