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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 37, Iss. 7 — Apr. 1, 2012
  • pp: 1247–1249

Aperiodic interferometer for six degrees of freedom position measurement

David P. Burt, Phillip S. Dobson, Kevin E. Docherty, Christopher W. Jones, Richard K. Leach, Stephen Thoms, Jonathan M.R. Weaver, and Yuan Zhang  »View Author Affiliations


Optics Letters, Vol. 37, Issue 7, pp. 1247-1249 (2012)
http://dx.doi.org/10.1364/OL.37.001247


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Abstract

We present a new class of interferometer system that is capable of simultaneous measurement of absolute position and rotation in all six degrees of freedom (DOF) with nanometer precision. This novel capability is due to the employment of a system of interference fringes that is not periodic. One of the key strengths offered by this new approach is that the absolute position of the system can be determined with a single measurement, rather than by counting fringes during displacement from a known location. The availability of a simultaneous measurement of all six DOF eliminates many problems associated with conventional interferometry.

© 2012 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 9, 2012
Revised Manuscript: January 30, 2012
Manuscript Accepted: January 30, 2012
Published: March 28, 2012

Citation
David P. Burt, Phillip S. Dobson, Kevin E. Docherty, Christopher W. Jones, Richard K. Leach, Stephen Thoms, Jonathan M.R. Weaver, and Yuan Zhang, "Aperiodic interferometer for six degrees of freedom position measurement," Opt. Lett. 37, 1247-1249 (2012)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-37-7-1247

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