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Bulk optical absorption of high resistivity silicon at 1550 nm

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Abstract

We report on the measurement of the optical absorption of bulk crystalline silicon at 1550 nm. Using the photodeflection technique, absorption as low as 5ppm/cm has been measured on a sample with a resistivity of 10kΩ·cm. The absorption as a function of the resistivity has been derived for n-type silicon.

© 2013 Optical Society of America

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