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Phase-shift anomaly caused by subwavelength-scale metal slit or aperture diffraction |
Optics Letters, Vol. 38, Issue 2, pp. 166-168 (2013)
http://dx.doi.org/10.1364/OL.38.000166
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Abstract
Terahertz time-domain spectroscopy probes anomalous phase-shift caused by wave diffraction from a subwavelength-scale metal slit or aperture. Carrier frequency phase measurements in the far-field region reveals that nearly 30° phase advance is induced from a subwavelength slit diffraction and that 180° phase-advance from a subwavelength aperture. These results indicate that the conventional 90° phase advance of diffracted waves in the far-field region, known as the Gouy phase shift, is not valid for subwavelength diffraction phenomena. The physical origin of these phase-shift anomalies is attributed to induced electric currents or magnetic dipole radiation, and theoretical analyses based on these factors are in good agreement with the experimental results.
© 2013 Optical Society of America
OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(050.5080) Diffraction and gratings : Phase shift
(300.6495) Spectroscopy : Spectroscopy, teraherz
(050.6624) Diffraction and gratings : Subwavelength structures
ToC Category:
Ultrafast Optics
History
Original Manuscript: November 5, 2012
Revised Manuscript: December 3, 2012
Manuscript Accepted: December 7, 2012
Published: January 9, 2013
Citation
Kanghee Lee, Minwoo Yi, Sang Eon Park, and Jaewook Ahn, "Phase-shift anomaly caused by subwavelength-scale metal slit or aperture diffraction," Opt. Lett. 38, 166-168 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-2-166
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