OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 21 — Nov. 1, 2013
  • pp: 4308–4311

Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation

Zhenkun Yu, Hongbo He, Wei Sun, Hongji Qi, Minghong Yang, Qiling Xiao, and Meiping Zhu  »View Author Affiliations


Optics Letters, Vol. 38, Issue 21, pp. 4308-4311 (2013)
http://dx.doi.org/10.1364/OL.38.004308


View Full Text Article

Enhanced HTML    Acrobat PDF (377 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The laser-induced damage threshold (LIDT) of a single-layer coating at the nanosecond (ns) regime is obviously lower than an uncoated substrate or a high reflectivity coating coated by the same material. To elucidate this phenomenon, we demonstrate the LIDT of three types of samples at 355 nm with 8 ns. High absorption defects are found at the film–substrate interface by comparing their LIDTs and damage morphologies. These defects originate from the substrate and appear during the coating process. Simulation results show that these defects, coupled to the coating, are mainly responsible for decreasing the damage threshold.

© 2013 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(160.2220) Materials : Defect-center materials
(310.6870) Thin films : Thin films, other properties

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: July 16, 2013
Revised Manuscript: September 2, 2013
Manuscript Accepted: September 17, 2013
Published: October 18, 2013

Citation
Zhenkun Yu, Hongbo He, Wei Sun, Hongji Qi, Minghong Yang, Qiling Xiao, and Meiping Zhu, "Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation," Opt. Lett. 38, 4308-4311 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-21-4308


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. T. W. Walker, A. H. Guenther, and P. E. Nielsen, IEEE J. Quantum Electron. 17, 2041 (1981). [CrossRef]
  2. T. W. Walker, A. H. Guenther, and P. E. Nielsen, IEEE J. Quantum Electron. 17, 2053 (1981). [CrossRef]
  3. M. R. Lange, J. K. Mclver, and A. H. Guenther, Thin Solid Films 125, 143 (1985). [CrossRef]
  4. B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996). [CrossRef]
  5. L. Yuan, Y. Zhao, G. Shang, C. Wang, H. He, J. Shao, and Z. Fan, J. Opt. Soc. Am. B 24, 538 (2007). [CrossRef]
  6. G. Liu, M. Zhou, G. Hu, X. Liu, Y. Jin, H. He, and Z. Fan, Appl. Surf. Sci. 256, 4206 (2010). [CrossRef]
  7. C. Wei, J. Shao, H. He, K. Yi, and Z. Fan, Opt. Express 16, 3376 (2008). [CrossRef]
  8. Y. Shan, H. He, C. Wei, Y. Wang, and Y. Zhao, Chin. Opt. Lett. 9, 103101 (2011). [CrossRef]
  9. X. Liu, Y. Zhao, Y. Gao, D. Li, G. Hu, M. Zhu, Z. Fan, and J. Shao, Appl. Opt. 52, 2194 (2013). [CrossRef]
  10. S. Papernov, A. Tait, W. Bittle, A. W. Schmid, J. B. Oliver, and P. Kupinski, J. Appl. Phys. 109, 113106 (2011). [CrossRef]
  11. R. M. O’Connell, Appl. Opt. 31, 4143 (1992). [CrossRef]
  12. J. Natoli, L. Gallais, H. Akhouayri, and C. Amra, Appl. Opt. 41, 3156 (2002). [CrossRef]
  13. H. Krol, L. Gallais, C. Grèzes-Besset, J. Natoli, and M. Commandré, Opt. Commun. 256, 184 (2005). [CrossRef]
  14. K. Yoshida, H. Yoshida, Y. Kato, and C. Yamanaka, Appl. Phys. Lett. 47, 911 (1985). [CrossRef]
  15. M. Otani, H. Fujimura, J. Ishikura, and K. Yoshida, J. Appl. Phys. 43, 6350 (2004).
  16. L. Jensen, M. Mende, S. Schrameyer, M. Jupé, and D. Ristau, Opt. Lett. 37, 4329 (2012). [CrossRef]
  17. L. Jensen, M. Mende, H. Blaschke, D. Ristau, D. Nguyen, L. Emmert, and W. Rudolph, Proc. SPIE 7842, 784207 (2010). [CrossRef]
  18. “Optical components for fire control instruments; general specification governing the manufacture, assembly, and inspection of,” Military Specification (1963).
  19. International Organization of Standardization, “Lasers and laser-related equipment—Determination of laser-induced damage threshold of optical surfaces—Part 1: 1-on-1 test,” (2000).
  20. P. E. Miller, T. I. Suratwala, L. L. Wong, M. D. Feit, J. A. Menapace, P. J. Davis, and R. A. Steele, Proc. SPIE 5991, 599101 (2006). [CrossRef]
  21. M. Yang, Y. Zhao, H. Shan, K. Yi, and J. Shao, Chin. J. Lasers 39, 803004 (2012). [CrossRef]
  22. P. W. Barber and S. C. Hill, Light Scattering by Particles: Computational Methods (World Scientific, 1998).
  23. X. Gao, G. Feng, J. Han, and L. Zhai, Opt. Express 20, 22095 (2012). [CrossRef]
  24. M. Weber, Handbook of Optical Materials (CRC Press, 2003).
  25. G. Duchateau and A. Dyan, Opt. Express 15, 4557 (2007). [CrossRef]
  26. J. Dijon, G. Ravel, and B. Andre, Proc. SPIE 3578, 398 (1999). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited