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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 21 — Nov. 1, 2013
  • pp: 4316–4319

Photonics-based microwave frequency measurement using a double-sideband suppressed-carrier modulation and an InP integrated ring-assisted Mach–Zehnder interferometer filter

Javier S. Fandiño and Pascual Muñoz  »View Author Affiliations


Optics Letters, Vol. 38, Issue 21, pp. 4316-4319 (2013)
http://dx.doi.org/10.1364/OL.38.004316


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Abstract

A photonic system capable of estimating the unknown frequency of a CW microwave tone is presented. The core of the system is a complementary optical filter monolithically integrated in InP, consisting of a ring-assisted Mach–Zehnder interferometer with a second-order elliptic response. By simultaneously measuring the different optical powers produced by a double-sideband suppressed-carrier modulation at the outputs of the photonic integrated circuit, an amplitude comparison function that depends on the input tone frequency is obtained. Using this technique, a frequency measurement range of 10 GHz (5–15 GHz) with a root mean square value of frequency error lower than 200 MHz is experimentally demonstrated. Moreover, simulations showing the impact of a residual optical carrier on system performance are also provided.

© 2013 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(130.6010) Integrated optics : Sensors
(060.5625) Fiber optics and optical communications : Radio frequency photonics
(130.7408) Integrated optics : Wavelength filtering devices

ToC Category:
Integrated Optics

History
Original Manuscript: August 5, 2013
Revised Manuscript: September 18, 2013
Manuscript Accepted: September 18, 2013
Published: October 21, 2013

Citation
Javier S. Fandiño and Pascual Muñoz, "Photonics-based microwave frequency measurement using a double-sideband suppressed-carrier modulation and an InP integrated ring-assisted Mach–Zehnder interferometer filter," Opt. Lett. 38, 4316-4319 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-21-4316

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