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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 22 — Nov. 15, 2013
  • pp: 4589–4592

Probing structural inhomogeneity of graphene layers via nonlinear optical scattering

Anton Y. Bykov, Pavel S. Rusakov, Elena D. Obraztsova, and Tatiana V. Murzina  »View Author Affiliations


Optics Letters, Vol. 38, Issue 22, pp. 4589-4592 (2013)
http://dx.doi.org/10.1364/OL.38.004589


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Abstract

Incoherent optical second harmonic generation (SHG) is studied from series of multilayer graphene samples of various thickness manufactured by chemical vapor deposition technique and deposited over 150 μm thick glass slides. Two different values of the correlation lengths are obtained from the linear and SHG indicatrices and reveal the existence of two types of optical scatterers. The first one is associated with homogeneous graphene areas, while the second one originates from wrinkles at the interdomain boundaries. Second harmonic imaging microscopy used to map the distribution of the second-order polarization at the nanoscale confirms the results of the nonlinear scattering data.

© 2013 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(190.4350) Nonlinear optics : Nonlinear optics at surfaces
(160.4236) Materials : Nanomaterials
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 9, 2013
Revised Manuscript: October 2, 2013
Manuscript Accepted: October 2, 2013
Published: November 5, 2013

Citation
Anton Y. Bykov, Pavel S. Rusakov, Elena D. Obraztsova, and Tatiana V. Murzina, "Probing structural inhomogeneity of graphene layers via nonlinear optical scattering," Opt. Lett. 38, 4589-4592 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-22-4589


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