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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 8 — Apr. 15, 2013
  • pp: 1325–1327

Reflection coefficient monitoring for optical interference coating depositions

Cheng-Chung Lee, Kai Wu, and Meng-Yen Ho  »View Author Affiliations


Optics Letters, Vol. 38, Issue 8, pp. 1325-1327 (2013)
http://dx.doi.org/10.1364/OL.38.001325


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Abstract

The real-time reflection coefficient (both of the reflection phase and the amplitude) at normal incidence of a single wavelength was acquired from the real-time spectrum of a broadband optical monitor. This is a powerful monitoring technique for multilayer interference coatings. The monitoring method shows high stability and good error compensation ability without deposition termination ambiguity. The experiments demonstrated that reflection coefficient monitoring has remarkable performance compared with other monitoring methods. Without changing the monitoring chip, the conventional broadband monitoring was improved 82% closer to the design by the proposed monitoring method.

© 2013 Optical Society of America

OCIS Codes
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication

ToC Category:
Thin Films

History
Original Manuscript: January 28, 2013
Revised Manuscript: March 14, 2013
Manuscript Accepted: March 19, 2013
Published: April 12, 2013

Citation
Cheng-Chung Lee, Kai Wu, and Meng-Yen Ho, "Reflection coefficient monitoring for optical interference coating depositions," Opt. Lett. 38, 1325-1327 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-8-1325

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