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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 9 — May. 1, 2013
  • pp: 1449–1451

Reflection measurements to reveal the absorption in nanowire arrays

Nicklas Anttu, Azhar Iqbal, Magnus Heurlin, Lars Samuelson, Magnus T. Borgström, Mats-Erik Pistol, and Arkady Yartsev  »View Author Affiliations

Optics Letters, Vol. 38, Issue 9, pp. 1449-1451 (2013)

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The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

© 2013 Optical Society of America

OCIS Codes
(300.1030) Spectroscopy : Absorption
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Thin Films

Original Manuscript: January 30, 2013
Revised Manuscript: March 14, 2013
Manuscript Accepted: March 29, 2013
Published: April 25, 2013

Nicklas Anttu, Azhar Iqbal, Magnus Heurlin, Lars Samuelson, Magnus T. Borgström, Mats-Erik Pistol, and Arkady Yartsev, "Reflection measurements to reveal the absorption in nanowire arrays," Opt. Lett. 38, 1449-1451 (2013)

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Fig. 1. Fig. 2. Fig. 3.

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