Abstract

We demonstrate the first reflection-based epi-illumination diffraction phase microscope with white light (epi-wDPM). The epi-wDPM system combines the off-axis, common-path, and white light approaches, in a reflection geometry enabling sub-nanometer spatial and temporal noise levels, while providing single-shot acquisition for opaque samples. We verified the epi-wDPM results by measuring control samples with known dimensions and comparing them to measurements from other well-established techniques. We imaged gold-coated HeLa cells to illustrate the tradeoffs between epi-wDPM with low and high spatial coherence.

© 2014 Optical Society of America

Diffraction phase microscopy with white light

Basanta Bhaduri, Hoa Pham, Mustafa Mir, and Gabriel Popescu
Opt. Lett. 37(6) 1094-1096 (2012)

White-light diffraction phase microscopy at doubled space-bandwidth product

Mingguang Shan, Mikhail E. Kandel, Hassaan Majeed, Viorel Nastasa, and Gabriel Popescu
Opt. Express 24(25) 29033-29039 (2016)

Effects of spatial coherence in diffraction phase microscopy

Chris Edwards, Basanta Bhaduri, Tan Nguyen, Benjamin G. Griffin, Hoa Pham, Taewoo Kim, Gabriel Popescu, and Lynford L. Goddard
Opt. Express 22(5) 5133-5146 (2014)

Diffraction phase microscopy: principles and applications in materials and life sciences

Basanta Bhaduri, Chris Edwards, Hoa Pham, Renjie Zhou, Tan H. Nguyen, Lynford L. Goddard, and Gabriel Popescu
Adv. Opt. Photon. 6(1) 57-119 (2014)

Structured illumination diffraction phase microscopy for broadband, subdiffraction resolution, quantitative phase imaging

Shwetadwip Chowdhury and Joseph Izatt
Opt. Lett. 39(4) 1015-1018 (2014)