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Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films

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Abstract

By using an evaporated silver film that has a continuously varying thickness, we have demonstrated the dependence of surface-enhanced Raman scattering (SERS) on the dielectric properties of the film. These results support local field models that are based on metal-particle resonances for SERS.

© 1981 Optical Society of America

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