The first reported demonstration of thermal diffusivity measurements using picosecond transient thermoreflectance is described. Although previously reported methods of measuring thermal transport properties of thin films require precise knowledge of the thermal properties of the substrate, this technique permits measurements on films as thin as 100 nm without any evidence of substrate interaction.
© 1986 Optical Society of America
Original Manuscript: December 26, 1985
Manuscript Accepted: February 20, 1986
Published: May 1, 1986
Carolyn A. Paddock and Gary L. Eesley, "Transient thermoreflectance from metal films," Opt. Lett. 11, 273-275 (1986)