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Optics Letters

Optics Letters


  • Vol. 12, Iss. 8 — Aug. 1, 1987
  • pp: 555–557

Integrated polarimeters based on anisotropic photodetectors

R. M. A. Azzam  »View Author Affiliations

Optics Letters, Vol. 12, Issue 8, pp. 555-557 (1987)

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Anisotropic detectors (AD's) can be designed by coating a photosensitive surface (e.g., Si) with a birefringent thin film whose principal axes are in the plane of the film. An integrated polarimeter (IP) is described that uses four linear photodetectors, of which three are AD's. The light beam, whose Stokes parameters (SP's) are to be measured, is relayed from one detector to the next by near-normal-incidence partial specular reflection while remaining in one plane. By a suitable choice of surface properties and orientations of the AD's, the four output electrical signals of the four detectors determine completely and unambiguously all four SP's. This IP with AD's (IPAD) has all the advantages of the previously described four-detector polarimeter [Opt. Lett. 10, 309 (1985)]. In addition, the IPAD offers a compact design with small-area detectors.

© 1987 Optical Society of America

Original Manuscript: March 2, 1987
Manuscript Accepted: May 20, 1987
Published: August 1, 1987

R. M. A. Azzam, "Integrated polarimeters based on anisotropic photodetectors," Opt. Lett. 12, 555-557 (1987)

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  1. R. M. A. Azzam, Opt. Lett. 10, 427 (1985);Appl. Opt. 25, 4224 (1986). [CrossRef] [PubMed]
  2. R. M. A. Azzam, Rev. Sci. Instrum. 56, 1746 (1985). [CrossRef]
  3. R. M. A. Azzam, Opt. Lett. 10, 309 (1985). [CrossRef] [PubMed]
  4. K. Berthold, W. Beinstingl, E. Gornik, Opt. Lett. 12, 69 (1987). [CrossRef] [PubMed]
  5. When α1 = α2 = 45°, r0 = r1 = r2 = r, ψ0 = ψ1 = ψ2 = ψ, and Δ1 = 90°, Eq. (4) gives det A = (k0k1k2k3)r6 sin3 2ψ cos3 2ψ. This result should replace Eq. (11) of Ref. 3, which was in error.
  6. R. M. A. Azzam, Opt. Commun. 20, 405 (1977). Equations (22)–(25) simplify for the present case of an isotropic substrate by setting N2x = N2y = N2. [CrossRef]
  7. D. E. Aspnes, A. A. Studna, Phys. Rev. B 27, 985 (1983);H. R. Philipp, J. Appl. Phys. 43, 2835 (1972). [CrossRef]
  8. Coherent interference within the thin film is responsible for the large reflection anisotropy that results from a small refractive-index difference (birefringence).

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