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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 13, Iss. 1 — Jan. 1, 1988
  • pp: 27–29

Continuous method for measuring the electro-optic coefficient in Bi12SiO20 and Bi12GeO20

P. Bayvel, M. McCall, and R. V. Wright  »View Author Affiliations


Optics Letters, Vol. 13, Issue 1, pp. 27-29 (1988)
http://dx.doi.org/10.1364/OL.13.000027


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Abstract

A technique for accurate measurement of the linear electro-optic coefficient(s) in crystals that are simultaneously optically active and birefringent is described. It is shown that this technique provides a direct method of measuring field-induced birefringence and so can form the basis of a Bi12SiO20 (or Bi12GeO20) sensor arrangement. The high degree of accuracy obtained in the measurements of the linear electro-optic coefficient in Bi12SiO20 and Bi12GeO20 crystals indicates the particular suitability of these materials in electric-field and voltage-sensor systems with a high dynamic range and for possible waveguiding applications.

© 1988 Optical Society of America

History
Original Manuscript: June 16, 1987
Manuscript Accepted: October 18, 1987
Published: January 1, 1988

Citation
P. Bayvel, M. McCall, and R. V. Wright, "Continuous method for measuring the electro-optic coefficient in Bi12SiO20 and Bi12GeO20," Opt. Lett. 13, 27-29 (1988)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-13-1-27

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