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Optics Letters

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  • Vol. 13, Iss. 10 — Oct. 1, 1988
  • pp: 934–936

Study of the thickness of liquid layers by moiré deflectometry

D. Yogev, S. Efrima, and O. Kafri  »View Author Affiliations


Optics Letters, Vol. 13, Issue 10, pp. 934-936 (1988)
http://dx.doi.org/10.1364/OL.13.000934


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Abstract

We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

© 1988 Optical Society of America

History
Original Manuscript: February 26, 1988
Manuscript Accepted: July 14, 1988
Published: October 1, 1988

Citation
D. Yogev, O. Kafri, and S. Efrima, "Study of the thickness of liquid layers by moiré deflectometry," Opt. Lett. 13, 934-936 (1988)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-13-10-934


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References

  1. H. A. Macleod, Thin Film Optical Filters (Macmillan, London, 1986). [CrossRef]
  2. O. Kafri, I. Glatt, Opt. Eng. 24, 944 (1985).
  3. D. Yogev, S. Efrima, “Novel silver metal liquidlike films,” Chem. Phys. (to be published).
  4. O. Kafri, I. Glatt, Appl. Opt. 27, 351 (1988). [CrossRef] [PubMed]

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