We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.
© 1988 Optical Society of America
Original Manuscript: February 26, 1988
Manuscript Accepted: July 14, 1988
Published: October 1, 1988
D. Yogev, O. Kafri, and S. Efrima, "Study of the thickness of liquid layers by moiré deflectometry," Opt. Lett. 13, 934-936 (1988)
- O. Kafri, I. Glatt, Opt. Eng. 24, 944 (1985).
- D. Yogev, S. Efrima, “Novel silver metal liquidlike films,” Chem. Phys. (to be published).
- H. A. Macleod, Thin Film Optical Filters (Macmillan, London, 1986). [CrossRef]
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