Abstract

We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

© 1988 Optical Society of America

Moire deflectometry with a focused beam: radius of curvature, microscopy, and thickness analysis

Oded Kafri, Eliezer Keren, Kathi Kreske, and Yaacov Zac
Appl. Opt. 29(1) 133-136 (1990)

Nonscanning Moiré deflectometry for measurement of nonlinear refractive index and absorption coefficient of liquids

Shahrzad Shahrabi Farahani, Khosro Madanipour, and Ata Koohian
Appl. Opt. 56(13) 3634-3638 (2017)

Direct determination of strain with diffraction-limit accuracy by moiré deflectometry

Oded Kafri, Eliezer Keren, and Kathi M. Kreske
Opt. Lett. 14(4) 193-195 (1989)

Electronic heterodyne readout of fringes in moiré deflectometry

J. Stricker
Opt. Lett. 10(6) 247-249 (1985)

Moiré deflectometry with pure sinusoidal gratings

E. Keren, A. Livnat, and I. Glatt
Opt. Lett. 10(4) 167-169 (1985)