Backscattering of silica-based glass waveguides is characterized for the first time to our knowledge by using an interferometric optical time-domain reflectometry system. High spatial resolution, as short as 15 μm, is obtained by using a newly developed 1.3-μm-wavelength superluminescent diode. Scattering centers produced by waveguide irregularities are clearly observed in glass optical waveguides. Waveguide loss and bend loss in the curved regions are estimated from the backscattered light intensity distribution.
© 1989 Optical Society of America
Original Manuscript: December 6, 1988
Manuscript Accepted: April 6, 1989
Published: July 1, 1989
Kazumasa Takada, Yoshio Noguchi, Norio Takato, and Juichi Noda, "Characterization of silica-based waveguides with an interferometric optical time-domain reflectometry system using a 1.3-μm-wavelength superluminescent diode," Opt. Lett. 14, 706-708 (1989)