An investigation of oblique plane-wave electromagnetic scattering from active dielectric films reveals the existence of anomalously large resonances that occur at discrete plane-wave angles of incidence. These resonances may be understood from a leaky-wave phase-matching condition whose predictions for the first few modes agree to within a few percent of those obtained from a rigorous treatment using Maxwell’s equations. Enhancement in the scattered-field intensities of the order of 100 was observed in experiments using finite-diameter pump and probe laser beams and active films as thin as 6 μm.
© 1989 Optical Society of America
Original Manuscript: May 23, 1989
Manuscript Accepted: August 18, 1989
Published: November 1, 1989
S. N. Mendenhall, O. M. Stafsudd, and N. G. Alexopoulos, "Phase-matched electromagnetic scattering in active dielectric films," Opt. Lett. 14, 1234-1236 (1989)