A unique combination of the time-correlated photon-counting technique and single-photon avalanche diode detectors gives an accurate characterization of gain-switched semiconductor lasers with picosecond resolution. The high sensitivity and the clean shape of the time response reveal even small features (reflections and relaxation oscillations), making a true optimization of the laser-diode operation possible. The technique outperforms the standard characterization with ultrafast p-i-n photodiodes and a sampling oscilloscope. In addition, compared with other methods, it has favorable features that greatly simplify the measurement.
© 1989 Optical Society of America
Original Manuscript: May 24, 1989
Manuscript Accepted: October 13, 1989
Published: December 15, 1989
S. Cova, A. Lacaita, M. Ghioni, and G. Ripamonti, "High-accuracy picosecond characterization of gain-switched laser diodes," Opt. Lett. 14, 1341-1343 (1989)