A high-bandwidth scanning Fabry–Perot wavemeter using polarizing reflectors is developed for far-infrared and millimeter waves. The strip directions of the two striped polarizing reflectors are made slightly different, and the reflectivity finesse is varied according to the relative angle of the two strip directions. By adjusting this angle one obtains the fringes of Fabry–Perot interference for a wide range of far-infrared and millimeter wavelengths. Experimental results show that the wavelength measurement range is approximately 100 to 3000 μm.
© 1989 Optical Society of America
Original Manuscript: August 25, 1988
Manuscript Accepted: January 4, 1989
Published: March 15, 1989
Toshihiro Hori, Ken’ichi Araki, Hideyuki Inomata, and Toshiaki Matsui, "Variable-finesse wideband Fabry–Perot wavemeter for far-infrared and millimeter waves," Opt. Lett. 14, 302-304 (1989)