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Optics Letters

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  • Vol. 15, Iss. 10 — May. 15, 1990
  • pp: 579–581

Correlation microscope

Stanley S. C. Chim and G. S. Kino  »View Author Affiliations


Optics Letters, Vol. 15, Issue 10, pp. 579-581 (1990)
http://dx.doi.org/10.1364/OL.15.000579


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Abstract

We have constructed a correlation microscope based on the Mirau interferometer configuration using a thin silicon nitride film beam splitter, and we have developed a method to extract the amplitude and phase information of the reflected signal from a sample located at the microscope object plane. An imaging theory for the interference microscope has been derived, which predicts accurately both the transverse response at a sharp edge and the range response to a perfect plane reflector.

© 1990 Optical Society of America

History
Original Manuscript: November 27, 1989
Manuscript Accepted: March 5, 1990
Published: May 15, 1990

Citation
Stanley S. C. Chim and G. S. Kino, "Correlation microscope," Opt. Lett. 15, 579-581 (1990)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-15-10-579


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References

  1. S. S. C. Chim, P. A. Beck, G. S. Kino, Rev. Sci. Instrum. 61, 980 (1990). [CrossRef]
  2. M. Davidson, K. Kaufman, I. Mazor, F. Cohen, Proc. Soc. Photo-Opt. Instrum. Eng. 775, 233 (1987).
  3. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968).
  4. P. C. D. Hobbs, G. S. Kino, “Generalizing the confocal microscope via heterodyne interferometry and digital filtering,” submitted to J. Microsc. [PubMed]

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