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Optics Letters

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  • Vol. 16, Iss. 1 — Jan. 1, 1991
  • pp: 53–55

Holographic interferometry using anisotropic self-diffraction in Bi12SiO20

R. C. Troth and J. C. Dainty  »View Author Affiliations


Optics Letters, Vol. 16, Issue 1, pp. 53-55 (1991)
http://dx.doi.org/10.1364/OL.16.000053


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Abstract

Anisotropic self-diffraction in photorefractive Bi12SiO20 crystals is applied to the investigation of dynamic holographic recording through the diffusion process. Specific attention is paid to optimization of experimental parameters for real-time holographic interferometry. The resultant interferometer is applied to obtain both time-average and double-exposure interferograms of vibrating and displaced structures.

© 1991 Optical Society of America

History
Original Manuscript: April 27, 1990
Manuscript Accepted: October 16, 1990
Published: January 1, 1991

Citation
R. C. Troth and J. C. Dainty, "Holographic interferometry using anisotropic self-diffraction in Bi12SiO20," Opt. Lett. 16, 53-55 (1991)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-16-1-53


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References

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