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  • Vol. 17, Iss. 10 — May. 15, 1992
  • pp: 713–715

Characterization of a new photorefractive material: K1−yLyT1−xNx

Aharon Agranat, Rudy Hofmeister, and Amnon Yariv  »View Author Affiliations


Optics Letters, Vol. 17, Issue 10, pp. 713-715 (1992)
http://dx.doi.org/10.1364/OL.17.000713


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Abstract

We report the growth and characterization of a new photorefractive material, potassium lithium tantalate niobate (KLTN). A KLTN crystal doped with copper is demonstrated to yield high diffraction efficiency of photorefractive gratings in the paraelectric phase. Voltage-controllable index gratings with n1, = 8.5 × 10−5 were achieved, which yielded diffraction efficiencies of 75% in a 2.9-mm-thick sample. In addition, diffraction was observed in the paraelectric phase without an applied field. This effect is attributed to a growth-induced strain field.

© 1992 Optical Society of America

History
Original Manuscript: January 15, 1992
Published: May 15, 1992

Citation
Aharon Agranat, Rudy Hofmeister, and Amnon Yariv, "Characterization of a new photorefractive material: K1−yLyT1−xNx," Opt. Lett. 17, 713-715 (1992)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-17-10-713


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References

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