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Optics Letters

Optics Letters


  • Vol. 17, Iss. 16 — Aug. 15, 1992
  • pp: 1128–1130

Simple method for measuring the linewidth enhancement factor of semiconductor lasers by optical injection locking

Koichi Iiyama, Ken-ichi Hayashi, and Yoshio Ida  »View Author Affiliations

Optics Letters, Vol. 17, Issue 16, pp. 1128-1130 (1992)

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A simple method for measuring the linewidth enhancement factor α of a semiconductor laser by optical injection locking is described. Without knowledge of the absolute values of detuning and the optical injection level, the value of α is evaluated from only changes in optical power in the stable optical injection-locking state. The value of α of a 0.83-μm channeled substrate planar laser is evaluated to be 2.65 ± 0.2. The measurement error of this method is also discussed.

© 1992 Optical Society of America

Original Manuscript: March 31, 1992
Published: August 15, 1992

Koichi Iiyama, Ken-ichi Hayashi, and Yoshio Ida, "Simple method for measuring the linewidth enhancement factor of semiconductor lasers by optical injection locking," Opt. Lett. 17, 1128-1130 (1992)

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