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  • Vol. 17, Iss. 16 — Aug. 15, 1992
  • pp: 1146–1148

High-temperature stability of a spectral hole burnt in Sm-doped SrFCl crystals

Jiahua Zhang, Shihua Huang, and Jiaqi Yu  »View Author Affiliations


Optics Letters, Vol. 17, Issue 16, pp. 1146-1148 (1992)
http://dx.doi.org/10.1364/OL.17.001146


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Abstract

A long-lived spectral hole at high temperature is observed in SrFCl:Sm. The measured hole lifetimes at 292 and 315 K are approximately 14 days and 16 h, respectively. Thermally induced hole filling is studied by using the time-decay experimental data of the hole area at different temperatures and by assuming a thermally activated process. An average thermal activation energy of 1.2 eV needed for hole filling is deduced.

© 1992 Optical Society of America

History
Original Manuscript: June 2, 1992
Published: August 15, 1992

Citation
Jiahua Zhang, Shihua Huang, and Jiaqi Yu, "High-temperature stability of a spectral hole burnt in Sm-doped SrFCl crystals," Opt. Lett. 17, 1146-1148 (1992)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-17-16-1146


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