A long-lived spectral hole at high temperature is observed in SrFCl:Sm. The measured hole lifetimes at 292 and 315 K are approximately 14 days and 16 h, respectively. Thermally induced hole filling is studied by using the time-decay experimental data of the hole area at different temperatures and by assuming a thermally activated process. An average thermal activation energy of 1.2 eV needed for hole filling is deduced.
© 1992 Optical Society of America
Original Manuscript: June 2, 1992
Published: August 15, 1992
Jiahua Zhang, Shihua Huang, and Jiaqi Yu, "High-temperature stability of a spectral hole burnt in Sm-doped SrFCl crystals," Opt. Lett. 17, 1146-1148 (1992)