Abstract

The polarization properties of diffraction from bismuth silicon oxide crystals are used to enhance the signal-to-noise ratio of a photorefractive particle image velocimeter. We explain these diffraction characteristics by using a simple picture of the processing steps and the beam-propagation method, accounting for the multiplicity of the recorded gratings. Experimental measurements are also presented.

© 1992 Optical Society of America

Holographic-recording improvement in a bismuth silicon oxide crystal by the moving-grating technique

Z. Q. Wang, W. A. Gillespie, and C. M. Cartwright
Appl. Opt. 33(32) 7627-7633 (1994)

Direct measurement of the electrogyratory effect in bismuth silicon oxide

Tristan J. Tayag, Theodore E. Batchman, and James J. Sluss
Appl. Opt. 31(5) 625-629 (1992)

Optical liquid-crystal-television correlator for particle-image-velocimetry processing

P. V. Farrell and D. Goetsch
Opt. Lett. 14(18) 978-980 (1989)

Observation of angularly tilted subharmonic gratings in photorefractive bismuth silicon oxide

Henrik C. Pedersen and Per Michael Johansen
Opt. Lett. 19(18) 1418-1420 (1994)

Three-wave and four-wave forward phase-conjugate imaging in photorefractive bismuth silicon oxide

D. C. Jones, S. F. Lyuksyutov, and L. Solymar
Opt. Lett. 15(17) 935-937 (1990)