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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 18, Iss. 19 — Oct. 1, 1993
  • pp: 1615–1617

Discrete electro-optic response in lead zirconate thin films from a field-induced phase transition

Feiling Wang, Kewen K. Li, Eugene Furman, and Gene H. Haertling  »View Author Affiliations


Optics Letters, Vol. 18, Issue 19, pp. 1615-1617 (1993)
http://dx.doi.org/10.1364/OL.18.001615


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Abstract

A discrete transverse electro-optic response associated with a field-induced antiferroelectric–ferroelectric phase transition has been observed to exist in lead zirconate thin films grown on Pt/Ti-coated silicon substrates. The magnitude of the birefringence jump from the antiferroelectric to the ferroelectric state is approximately 2.5 × 10−2. Quantitative correlation between the field-induced birefringence and the polarization was also experimentally studied. The discrete birefringent change in the thin films may be a desirable property for applications in optical switches or other integrated-optical devices.

© 1993 Optical Society of America

History
Original Manuscript: May 4, 1993
Published: October 1, 1993

Citation
Feiling Wang, Kewen K. Li, Eugene Furman, and Gene H. Haertling, "Discrete electro-optic response in lead zirconate thin films from a field-induced phase transition," Opt. Lett. 18, 1615-1617 (1993)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-18-19-1615

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