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Optics Letters

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  • Vol. 18, Iss. 5 — Mar. 1, 1993
  • pp: 391–393

Roughness determination by speckle–wavelength decorrelation

Donald J. Schertler and Nicholas George  »View Author Affiliations


Optics Letters, Vol. 18, Issue 5, pp. 391-393 (1993)
http://dx.doi.org/10.1364/OL.18.000391


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Abstract

A technique is described for calculating the roughness and probability density function of a surface based on the decorrelation of imaged speckle with wavelength. The decorrelation provides information about the first-order statistical properties of the imaged surface. Surfaces with rms roughnesses of greater than ~1 μm. can be scanned over the 80-nm range of the dye-laser system.

© 1993 Optical Society of America

History
Original Manuscript: October 1, 1992
Published: March 1, 1993

Citation
Donald J. Schertler and Nicholas George, "Roughness determination by speckle–wavelength decorrelation," Opt. Lett. 18, 391-393 (1993)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-18-5-391


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References

  1. N. George, A. Jain, Appl. Phys. 4, 201 (1974). [CrossRef]
  2. N. George, A. Jain, R. D. S. Melville, Appl. Phys. 7, 157 (1975). [CrossRef]
  3. T. S. McKechnie, in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, New York, 1982), p. 123.
  4. C. Wykes, Opt. Acta 24, 517 (1977). [CrossRef]
  5. J. W. Goodman, in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, New York, 1982), p. 9.
  6. D. Leger, J. C. Perrin, J. Opt. Soc. Am. 66, 1210 (1976). [CrossRef]
  7. W. T. Welford, Opt. Quantum Electron. 9, 269 (1977). [CrossRef]
  8. H. Fujii, T. Asakura, Opt. Commun. 11, 35 (1974). [CrossRef]
  9. N. George, Opt. Eng. 25, 754 (1986).

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