A technique is described for calculating the roughness and probability density function of a surface based on the decorrelation of imaged speckle with wavelength. The decorrelation provides information about the first-order statistical properties of the imaged surface. Surfaces with rms roughnesses of greater than ~1 μm. can be scanned over the 80-nm range of the dye-laser system.
© 1993 Optical Society of America
Original Manuscript: October 1, 1992
Published: March 1, 1993
Donald J. Schertler and Nicholas George, "Roughness determination by speckle–wavelength decorrelation," Opt. Lett. 18, 391-393 (1993)