Roughness determination by speckle-wavelength decorrelation
Optics Letters, Vol. 18, Issue 5, pp. 391-393 (1993)
http://dx.doi.org/10.1364/OL.18.000391
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Abstract
A technique is described for calculating the roughness and probability density function of a surface based on the decorrelation of imaged speckle with wavelength. The decorrelation provides information about the first-order statistical properties of the imaged surface. Surfaces with rms roughnesses of greater than ~1 µm can be scanned over the 80-nm range of the dye-laser system.
© 1993 Optical Society of America
Citation
Donald J. Schertler and Nicholas George, "Roughness determination by speckle-wavelength decorrelation," Opt. Lett. 18, 391-393 (1993)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-18-5-391
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