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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 19, Iss. 11 — Jun. 1, 1994
  • pp: 780–782

Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy

Stefan W. Hell and Jan Wichmann  »View Author Affiliations


Optics Letters, Vol. 19, Issue 11, pp. 780-782 (1994)
http://dx.doi.org/10.1364/OL.19.000780


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Abstract

We propose a new type of scanning fluorescence microscope capable of resolving 35 nm in the far field. We overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function. In contrast to near-field scanning optical microscopy, this method can produce three-dimensional images of translucent specimens.

© 1994 Optical Society of America

History
Original Manuscript: March 7, 1994
Published: June 1, 1994

Citation
Stefan W. Hell and Jan Wichmann, "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy," Opt. Lett. 19, 780-782 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-11-780

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