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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 19, Iss. 13 — Jul. 1, 1994
  • pp: 995–997

Dispersive interferometric profilometer

J. Schwider and Liang Zhou  »View Author Affiliations


Optics Letters, Vol. 19, Issue 13, pp. 995-997 (1994)
http://dx.doi.org/10.1364/OL.19.000995


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Abstract

The usual automated interferometric profilometers suffer from phase-unwrapping problems. We discuss a one-dimensional method for the absolute determination of the path difference in interferometers to obtain unique surface profiles with high accuracy.

© 1994 Optical Society of America

History
Original Manuscript: February 14, 1994
Published: July 1, 1994

Citation
J. Schwider and Liang Zhou, "Dispersive interferometric profilometer," Opt. Lett. 19, 995-997 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-13-995


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References

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