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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 19, Iss. 15 — Aug. 1, 1994
  • pp: 1116–1118

Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

Kyu-Haeng Lee, Wook-Rae Cho, Jung-Ho Park, Jong-Sup Kim, Seung-Han Park, and Ung Kim  »View Author Affiliations


Optics Letters, Vol. 19, Issue 15, pp. 1116-1118 (1994)
http://dx.doi.org/10.1364/OL.19.001116


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Abstract

Self-defocusing and nonlinear absorption resulting from two-photon-excited free charge carriers were observed in polycrystalline ZnSe at the low power density of ~ 30 MW/cm2 by use of the Z-scan technique with nanosecond laser pulses. The total carrier absorption cross section and the variation of refractive index per unit of photoexcited carrier density were estimated to be 0.80 ± 0.10 × 10−18 cm2 and 0.60 ± 0.15 × 10−21 cm3, respectively.

© 1994 Optical Society of America

History
Original Manuscript: February 28, 1994
Published: August 1, 1994

Citation
Kyu-Haeng Lee, Wook-Rae Cho, Jung-Ho Park, Jong-Sup Kim, Seung-Han Park, and Ung Kim, "Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser," Opt. Lett. 19, 1116-1118 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-15-1116

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