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Optics Letters

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  • Vol. 19, Iss. 16 — Aug. 15, 1994
  • pp: 1252–1254

Optimization of a femtosecond ellipsometer for gold photoreflectance studies

Michael Y. Frankel  »View Author Affiliations


Optics Letters, Vol. 19, Issue 16, pp. 1252-1254 (1994)
http://dx.doi.org/10.1364/OL.19.001252


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Abstract

I develop a quantitative optimization procedure for femtosecond reflectance ellipsometer measurements. The femtosecond ellipsometer eliminates the need for separate thin-film reflectance and transmittance measurements and allows self-consistent determination of dielectric index changes of optically thick films on arbitrary substrates. I verify the optimization procedure and use the femtosecond ellipsometric measurements to investigate the photoreflectance of an optically thick gold film. A comparison of the extracted real and imaginary dielectric function components reveals evidence of thermalized and nonthermalized hot-electron populations.

© 1994 Optical Society of America

History
Original Manuscript: February 24, 1994
Published: August 15, 1994

Citation
Michael Y. Frankel, "Optimization of a femtosecond ellipsometer for gold photoreflectance studies," Opt. Lett. 19, 1252-1254 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-16-1252


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