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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 19, Iss. 20 — Oct. 15, 1994
  • pp: 1657–1659

High-resolution surface-emitting spectrometer and deformation sensors with nonlinear waveguides

E. Frlan, J. S. Wight, S. Janz, H. Dai, F. Chatenoud, M. Buchanan, and R. Normandin  »View Author Affiliations


Optics Letters, Vol. 19, Issue 20, pp. 1657-1659 (1994)
http://dx.doi.org/10.1364/OL.19.001657


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Abstract

We investigate the limits of frequency resolution attainable in a nonlinear waveguide optical spectrometer, including the effects that are due to surface distortions and waveguide inhomogeneities, and demonstrate that the frequency-resolving capability is directly scalable with the radiating aperture length. The resolution of the waveguide is diffraction limited, and therefore the far-field radiation pattern can be used to characterize the phase variations along the waveguide that are due to surface distortions. The use of this device as a highly sensitive deformation sensor is demonstrated by application of a distortion to the waveguide and confirmation of the far-field diffraction pattern generated.

© 1994 Optical Society of America

History
Original Manuscript: April 29, 1994
Published: October 15, 1994

Citation
S. Janz, E. Frlan, J. S. Wight, H. Dai, F. Chatenoud, M. Buchanan, and R. Normandin, "High-resolution surface-emitting spectrometer and deformation sensors with nonlinear waveguides," Opt. Lett. 19, 1657-1659 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-20-1657

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