We investigate the limits of frequency resolution attainable in a nonlinear waveguide optical spectrometer, including the effects that are due to surface distortions and waveguide inhomogeneities, and demonstrate that the frequency-resolving capability is directly scalable with the radiating aperture length. The resolution of the waveguide is diffraction limited, and therefore the far-field radiation pattern can be used to characterize the phase variations along the waveguide that are due to surface distortions. The use of this device as a highly sensitive deformation sensor is demonstrated by application of a distortion to the waveguide and confirmation of the far-field diffraction pattern generated.
© 1994 Optical Society of America
Original Manuscript: April 29, 1994
Published: October 15, 1994
S. Janz, E. Frlan, J. S. Wight, H. Dai, F. Chatenoud, M. Buchanan, and R. Normandin, "High-resolution surface-emitting spectrometer and deformation sensors with nonlinear waveguides," Opt. Lett. 19, 1657-1659 (1994)