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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 19, Iss. 23 — Dec. 1, 1994
  • pp: 1919–1921

Scanning microscopy through thick layers based on linear correlation

M. Kempe and W. Rudolph  »View Author Affiliations


Optics Letters, Vol. 19, Issue 23, pp. 1919-1921 (1994)
http://dx.doi.org/10.1364/OL.19.001919


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Abstract

Scanning microscopy in combination with an interferometric correlation technique that uses short light pulses or broadband cw light is shown to permit enhanced depth discrimination, which is particularly useful for imaging through thick layers introducing spherical aberration and through scattering media.

© 1994 Optical Society of America

History
Original Manuscript: April 29, 1994
Published: December 1, 1994

Citation
M. Kempe and W. Rudolph, "Scanning microscopy through thick layers based on linear correlation," Opt. Lett. 19, 1919-1921 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-23-1919


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References

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