Scanning microscopy through thick layers based on linear correlation
Optics Letters, Vol. 19, Issue 23, pp. 1919-1921 (1994)
http://dx.doi.org/10.1364/OL.19.001919
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Abstract
Scanning microscopy in combination with an interferometric correlation technique that uses short light pulses or broadband cw light is shown to permit enhanced depth discrimination, which is particularly useful for imaging through thick layers introducing spherical aberration and through scattering media.
© 1994 Optical Society of America
Citation
M. Kempe and W. Rudolph, "Scanning microscopy through thick layers based on linear correlation," Opt. Lett. 19, 1919-1921 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-23-1919
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