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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 19, Iss. 4 — Feb. 15, 1994
  • pp: 302–304

Low-coherence reflectometry for stationary lateral and depth profiling with acousto-optic deflectors and a CCD camera

A. Knüttel, J. M. Schmitt, and J. R. Knutson  »View Author Affiliations


Optics Letters, Vol. 19, Issue 4, pp. 302-304 (1994)
http://dx.doi.org/10.1364/OL.19.000302


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Abstract

We describe a new optical low-coherence reflectometer for depth and lateral scanning without moving parts. The reflectometer covers a range of 0.4 and 1 mm in the depth and lateral dimensions, respectively. This level was accomplished by an acousto-optic deflector for lateral scanning and temporal-coherence gating for depth resolution. The ac component of the reflected light was captured by a cooled 16-bit CCD camera with a special readout scheme. As a proof of principle, optical depths of a staggered stack of glass plates were measured.

© 1994 Optical Society of America

History
Original Manuscript: September 8, 1993
Published: February 15, 1994

Citation
A. Knüttel, J. M. Schmitt, and J. R. Knutson, "Low-coherence reflectometry for stationary lateral and depth profiling with acousto-optic deflectors and a CCD camera," Opt. Lett. 19, 302-304 (1994)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-19-4-302

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