We introduce a simple modification to the Z-scan technique that results in a sensitivity enhancement that permits measurement of nonlinearly induced wave-front distortion of ≃λ/104. This sensitivity was achieved with 10-Hz repetition-rate pulsed laser sources. Sensitivity to nonlinear absorption is also enhanced by a factor of ≃3. This method permits characterization of nonlinear thin films without the need for waveguiding.
© 1994 Optical Society of America
Original Manuscript: August 13, 1993
Published: March 1, 1994
T. Xia, D. J. Hagan, M. Sheik-Bahae, and E. W. Van Stryland, "Eclipsing Z-scan measurement of λ/104 wave-front distortion," Opt. Lett. 19, 317-319 (1994)